DOJ-OGR-00028568.jpg
342 KB
Extraction Summary
1
People
2
Organizations
2
Locations
1
Events
0
Relationships
0
Quotes
Document Information
Type:
Secondary inspection record
File Size:
342 KB
Summary
This document is a U.S. government record of a secondary inspection conducted on Jeffrey Epstein at JFK Airport in New York on April 1, 2000. Epstein arrived on carrier 'AF' from 'CDG' and underwent a bag examination. Key details, including the reason for the referral and any remarks, have been redacted.
People (1)
| Name | Role | Context |
|---|---|---|
| JEFFREY EPSTEIN | Traveler |
Subject of a secondary inspection upon entry to the United States.
|
Organizations (2)
| Name | Type | Context |
|---|---|---|
| AF | Airline |
Listed as the carrier for Jeffrey Epstein's flight.
|
| U.S. Department of Justice | Government Agency |
Implied by the document identifier 'DOJ-OGR-00028568' in the footer.
|
Timeline (1 events)
2000-04-01
Jeffrey Epstein was referred for a secondary inspection upon arrival at JFK Airport. The inspection included a bag exam but not a personal search, and was completed at 08:16. The reason for the referral and remarks are redacted.
NEW YORK, JFK AIRPORT
Locations (2)
| Location | Context |
|---|---|
|
The port of entry where the secondary inspection occurred.
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Listed as the departure/destination and embarkation point for the flight.
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